Hommel-Etamic – Waveline W900
The W800 and W900 measuring systems offer highest flexibility for day-to-day measurement applications. The uniform machine concept and modern probe systems follow the modular design which provides various customization options of the measuring station. This way the system can easily be adapted to your specific infrastructure and measurement requirements.
With fast measuring axes, W900 measuring systems guarantee short measuring cycles in complex measurement tasks, therefore meeting the most stringent requirements of measurement technology. In conjunction with the Nanoscan probe system, the high-precision traverse unit provides excellent measuring accuracy in combined roughness and contour measurements. W900 measuring systems offer leading quality in roughness, radius, angle and diameter measurements.
Features:
- Fast measurement technology
- Excellent measuring accuracy
- Traverse unit with interfaces for two probe systems
- Innovative complete solution
- Highly flexible, dynamic measurement
- Extensive automation options
Specifications
Resolution | 0.3 nm |
Resolution scale (x-axis) | 0.01 µm |
Tilt range | ±45° |
Number of probe systems interfaces | 2, bottom & front |
Models
Standard roughness measuring station
W912R / W920R
Standard contour measuring station
W912C / W920C digiscan
Combined roughness and contour measuring station
with separated probe systems
W912RC / W920RC digiscan
Ideal configuration of your measuring system
Four different probe systems with quick-change adapters QCA allow quick and simple system changeovers to
accommodate new measurement tasks. In conjunction with the selected measuring station configuration
and the Evovis software, this means the ideal measurement performance is always achieved.
Surfscan
- Changing of the probe arm without tools
- Electronic probe arm detection
- Extendable to top/bottom measuring
- High-resolution roughness measurement across
the full measuring range
Nanoscan
- Ultra-precise opto-mechanical probe system
- Wide measuring range with extremely high resolution
- Excellent roughness and contour measuring accuracy
Digiscan
- Probe arm change without the need for tools
- Electronic probe arm detection
- Top/bottom measurement possible (software option)
- Quick and easy calibration of the probe arms
TKU400
- Simple changeover to transverse measurement
- Highest resolution across the full measuring range
Any more questions?
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